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Ultrasonic Bonding Interface Degradation Characteristics of Gold-Coated Silver Wire for Semiconductor Packaging |
Mi-Song Kim, Won Sik Hong, Sang Yeop Kim, Sung Min Jeon, Jeong Tak Moon |
J Weld Join. 2021;39(4):343-348. Published online 2021 August 11 DOI: https://doi.org/10.5781/JWJ.2021.39.4.1 |
Ultrasonic Bonding Interface Degradation Characteristics of Gold-Coated Silver Wire for Semiconductor Packaging Effect of Continuous Casting Parameters on Microstructure and Texture of Gold Bonding Wire for Semiconductor Packaging The Ultrasonic Welding Mechanism as Applied to Aluminum-and Gold-Wire Bonding in Microelectronics Process and Consumable Development for Silver Wire Bonding The wire sag problem in wire bonding technology for semiconductor packaging Pure silver wire bonding on palladium finishing for automotive application The ultrasonic welding mechanism as applied to aluminium- and gold-wire bonding in microelectronics The ultrasonic welding mechanism as applied to aluminum- and gold-wire bonding in microelectronics High-Speed Bonding of Resin-Coated Cu Wire and Sn Electrode with Ultrasonic Bonding for High-Frequency Chip Coil Assessing of Wire Bonding on Gold Plated Pads on Epoxy Mold Compound Wafer |
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